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Satake BELTUZA SPECTRA
X-ray and deep-learning separation for hidden almond defects.
What it does
BELTUZA SPECTRA combines X-ray inspection with deep learning to distinguish acceptable almonds from insect damage, half-splits and doubles. RGB and NIR inspection add external and material information alongside the internal-defect workflow.
Who it is for
Almond processors prioritizing hidden internal defects as well as external appearance.
What stands out
- X-ray imaging with deep-learning classification
- Selectable internal-defect rejection categories
- RGB, shape and NIR inspection
Limitations to consider
- Performance depends on incoming product and settings.
- Models for other commodities need separate application confirmation.
Integrations & connections
Tasks it can help with
Sources & verification
This profile is based on vendor documentation, checked Oct 24, 2026. It is not a hands-on review or a performance benchmark. Unknown details are marked explicitly.
Current X-ray, AI and almond defect capabilitiesRegional optical portfolio and project quotationSuggest a correction